80L Constant temperature and humidity test chamber for electronics and semiconductors

At high temperatures, the test can reveal potential issues such as softening, reduced performance, altered characteristics, potential damage, and oxidation of product components and materials (for example, the softening or melting of fillers and seals, decreased stability and insulation damage in electronic circuits, and accelerated aging of polymers and insulators). At low temperatures, the test can reveal issues such as cracking, brittleness, jamming of moving parts, and altered characteristics (for example, hardening and brittleness of materials, changes in the performance of electronic components, water condensation and ice formation, and mechanical structural changes due to material contraction).